Process Yield Analysis for Nonlinear Profiles in the Presence of Gauge Measurement Errors-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Process Yield Analysis for Nonlinear Profiles in the Presence of Gauge Measurement Errors

Published:2015-12-22 Issue:7 Volume:32 Page:2435-2442
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Qual. Reliab. Engng. Int.

Author:

Wang Fu-Kwun¹

Affiliation:

1. Department of Industrial Management; National Taiwan University of Science and Technology; Taipei 106 Taiwan

Funder

Ministry of Science and Technology in Taiwan

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference24 articles.

1. Process capability with asymmetric tolerances;Boyles;Communications in Statistics - Simulation and Computation,1994

2. A review of methods for measurement systems capability analysis;Burdick;Journal of Quality Technology,2003

3. Measurement Error Effects on the Performance of Process Capability Indices

4. Statistical analysis of process capability indices with measurement errors;Bordignon;Quality and Reliability Engineering International,2002

5. Estimation of Cp for autocorrelated data and measurement errors;Scagliarini;Communications in Statistics - Theory and Methods,2002

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Assessing process capability index using sampling plan in the presence of measurement system errors;The International Journal of Advanced Manufacturing Technology;2019-02-13

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP