A method to study the electric field distribution on sample surfaces in atom probe analysis

Author:

Chen Sunwei1ORCID,Suzuki Takumi1,Tomiyasu Bunbunoshin12,Owari Masanori12

Affiliation:

1. Institute of Industrial ScienceThe University of Tokyo Tokyo Japan

2. Environmental Science CenterThe University of Tokyo Tokyo Japan

Funder

JSPS KAKENHI

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference17 articles.

1. Atom probe tomography;Kelly TF;Rev. Sci. Instrum.,2007

2. Design of a femtosecond laser assisted tomographic atom probe;Gault B;Rev. Sci. Instrum.,2006

3. Pulsed‐laser atom‐probe field‐ion microscopy

4. The interaction of O2 and residual H on Pt surface studied by field ion microscopy and in‐situ surface atom probe;Chen S;J Surf Anal,2019

5. Atom Probe Microscopy

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