Monte Carlo simulation study of reflection electron energy loss spectroscopy of an Fe/Si overlayer sample-Reference-Cited by-同舟云学术

Monte Carlo simulation study of reflection electron energy loss spectroscopy of an Fe/Si overlayer sample

Published:2020-07-23 Issue:11 Volume:52 Page:742-754
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Da Bo¹²^ORCID,Yang Lihao¹³^ORCID,Liu Jiangwei⁴,Li Yonggang⁵,Mao Shifeng⁶,Ding Zejun³

Affiliation:

1. Research and Services Division of Materials Data and Integrated System National Institute for Materials Science Ibaraki Japan

2. Research Center for Advanced Measurement and Characterization National Institute for Materials Science Ibaraki Japan

3. Hefei National Laboratory for Physical Sciences at the Microscale and Department of Physics University of Science and Technology of China Hefei China

4. Research Center for Functional Materials National Institute for Materials Science Ibaraki Japan

5. Key Laboratory of Materials Physics, Institute of Solid State Physics Chinese Academy of Sciences Hefei China

6. Department of Engineering and Applied Physics University of Science and Technology of China Hefei China

Funder

National Natural Science Foundation of China

Science Challenge Project

Youth Innovation Promotion Association of the Chinese Academy of Sciences

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6864

Reference43 articles.

1. Differential inelastic electron scattering cross sections from experimental reflection electron-energy-loss spectra: Application to background removal in electron spectroscopy

2. Model for quantitative analysis of reflection-electron-energy-loss spectra

3. Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms

4. Dielectric and optical properties of Zr silicate thin films grown on Si(100) by atomic layer deposition

5. Use of sum rules on the energy-loss function for the evaluation of experimental optical data

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