Experimental test and life estimation of the OLED at normal working stress based on the luminance degradation model-Reference-Cited by-同舟云学术

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Experimental test and life estimation of the OLED at normal working stress based on the luminance degradation model

Published:2014-07-14 Issue:4 Volume:30 Page:371-375
ISSN:1522-7235
Container-title:Luminescence
language:en
Short-container-title:Luminescence

Author:

Zhang J. P.¹,Wang C.¹,Chen X.²,Cheng G. L.²,Qiu Y. J.²,Shen M.-H. H.³

Affiliation:

1. College of Energy and Mechanical Engineering; Shanghai University of Electric Power; Shanghai 200090 China

2. Shanghai Tianyi Electric CO., LTD; Shanghai 201611 China

3. Department of Mechanical and Aerospace Engineering; The Ohio State University; Columbus OH 43210 USA

Publisher

Wiley

Subject

Chemistry (miscellaneous),Biophysics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/bio.2741/fullpdf

Reference17 articles.

1. Xia SC Kwong RC Adamovich VI Weaver MS Brown JJ OLED device operational lifetime: insights and challenges 2007

2. Driving schemes for a-Si and LTPS AMOLED displays;Nathan;J Display Technol,2005

3. OLED technology and its industrialization development in China;Wen;Semicond Tech,2011

4. Accelerated life test planning with independent weibull competing risks with known shape parameter;Pascual;Reliab IEEE Trans,2007

5. The progress of application technology about the OLED;Chang;Vac Cryogenics,2008

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