Extreme Ultra‐Wideband Optoelectronic Frequency‐Modulated Continuous‐Wave Terahertz Radar

Author:

Mohammadzadeh Shiva1ORCID,Keil Andreas12,Kocybik Michael1ORCID,Schwenson Lauri Maximilian3,Liebermeister Lars3,Kohlhaas Robert3ORCID,Globisch Björn4,von Freymann Georg15ORCID,Seewig Jörg6,Friederich Fabian1ORCID

Affiliation:

1. Department for Materials Characterization and Testing Fraunhofer Institute for Industrial Mathematics ITWM 67663 Kaiserslautern Germany

2. Becker Photonik GmbH 32429 Minden Germany

3. Fraunhofer Institute for Telecommunications Heinrich Hertz Institute HHI 10587 Berlin Germany

4. Toptica Eagleyard 12489 Berlin Germany

5. Department of Physics and Research Center OPTIMAS RPTU Kaiserslautern 67663 Kaiserslautern Germany

6. Institute for Measurement and Sensor Technology RPTU Kaiserslautern 67663 Kaiserslautern Germany

Abstract

AbstractA novel photonic terahertz measurement system based on a frequency‐modulated continuous‐wave (FMCW) radar approach is presented. In previous works, fast frequency modulation has been demonstrated in connection with a continuous wave terahertz spectroscopy setup based on the photomixing principle. In this paper, a terahertz radar based on both a photomixing transmitter and a photomixing receiver, in contrast to the rigid spectroscopy approach, is reported. Hereby, frequency modulation bandwidths of more than 1.65 THz in radar operation is achieved. This corresponds to an order of magnitude more than what is previously achieved by terahertz radar systems. At the same time, measurement rates can be achieved that are comparable with radar systems based on Monolithic Microwave Integrated Circuits (MMICs) according to the current state of the art. Within the scope of the work, two operating modes are realized, one with a measurement rate of about 560 Hz at 600 GHz modulation bandwidth and one with 200 Hz at 1.65 THz modulation bandwidth, which can be set within the spectrum from 50 GHz to about 4.5 THz. The possibility to adjust the operating range of the radar without necessary hardware adaptations is another unique feature of the presented system, which allows the operator to choose a suitable frequency band that corresponds best to a certain measurement scheme via software settings. Besides the potential for multi‐layer thickness inspections, the capabilities of this technique for terahertz imaging applications are presented.

Funder

Bundesministerium für Bildung und Forschung

Publisher

Wiley

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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