Investigating the agreement between polarized and unpolarized densitometry in offset lithography printing
Author:
Affiliation:
1. Rochester Institute of Technology College of Engineering Technology, Print and Graphic Media Science Rochester New York USA
2. Institute of Pure and Applied Sciences Marmara University Istanbul Turkey
Funder
Western Michigan University
Publisher
Wiley
Subject
General Chemical Engineering,General Chemistry,Human Factors and Ergonomics
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/col.22840
Reference23 articles.
1. Review of instrumental inter-agreement study of spectral and colorimetric data of commercial multiangle spectrophotometers
2. Characterization and optimization of color attributes chroma ( C *) and lightness ( L *) in offset lithography halftone print on packaging boards
3. Evaluation of intermodel agreement using ISO 13655 M0, M1, and M2 measurement modes in commercial spectrophotometers
4. What it means to measure color "inline";Stehn G;X‐Rite,2019
5. Print quality evaluation and applied colour management in coldset offset newspaper print
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