Local structural analysis of In-doped Bi2 Se3 topological insulator using X-ray fluorescence holography-Reference-Cited by-同舟云学术

Local structural analysis of In-doped Bi2 Se3 topological insulator using X-ray fluorescence holography

Published:2018-09-06 Issue:1 Volume:51 Page:51-55
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Kimura Koji¹^ORCID,Hayashi Koichi¹²,Yashina Lada V.³,Happo Naohisa⁴,Nishioka Takumi¹,Yamamoto Yuta¹,Ebisu Yoshihiro⁵,Ozaki Toru⁵,Hosokawa Shinya⁶,Matsushita Tomohiro⁷,Tajiri Hiroo⁷

Affiliation:

1. Department of Physical Science and Engineering; Nagoya Institute of Technology; Nagoya Japan

2. Frontier Research Institute for Materials Science; Nagoya Institute of Technology; Nagoya Japan

3. Department of Chemistry; Moscow State University; Moscow Russia

4. Department of Computer and Network Engineering; Hiroshima City University; Hiroshima Japan

5. Graduate School of Science and Technology; Hiroshima Institute of Technology; Hiroshima Japan

6. Department of Physics; Kumamoto University; Kumamoto Japan

7. Japan Synchrotron Radiation Research Institute (JASRI); SPring-8; Sayo Japan

Funder

Ministry of Education, Culture, Sports, Science, and Technology of Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.6544/fullpdf

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5. Observation of a large-gap topological-insulator class with a single Dirac cone on the surface;Xia;Nat Phys,2009

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