Quantifying and modeling the impact of interconnection failures on the electrical performance of crystalline silicon photovoltaic modules

Author:

Annigoni Eleonora1ORCID,Virtuani Alessandro1ORCID,Levrat Jacques2,Faes Antonin2ORCID,Sculati‐Meillaud Fanny1,Despeisse Matthieu2,Ballif Christophe12

Affiliation:

1. École Polytechnique Fédérale de Lausanne (EPFL), Institute of Microengineering (IMT)Photovoltaics and Thin Film Electronics Laboratory (PV‐Lab) Neuchâtel CH‐2002 Switzerland

2. CSEM, PV‐Center Neuchâtel CH‐2002 Switzerland

Funder

EOS Holding

Swiss Commission for Technology and Innovation

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. IEA “Review of failures of photovoltaic modules—report IEA‐PVPS T13–01:2014 ”2014.

2. PV degradation curves: non‐linearities and failure modes

3. KatoK.“PVRessQ!”—a research activity on reliability of PV system from an user's viewpoint in Japan In SPIE 2011.

4. DeGraafD LacerdaR CampeauZ Sunpower Corp. “Degradation mechanisms in Si module technologies observed in the field; their analysis and statistics " in NREL Photovoltaic Module Reliability Workshop: Golden (Colorado) 2011.

5. DubeyR ChattopadhyayS KuthanazhiV et al. “All‐India survey of photovoltaic module degradation: 2013 ” National Centre for photovoltaic research and education Indian Institute of Technology Bombay National Institute of Solar Energy 2013.

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