Thickness dependence of the structural, mechanical and electrical properties of Ni films deposited on polyimide by ion beam-assisted deposition (IBAD)-Reference-Cited by-同舟云学术

Thickness dependence of the structural, mechanical and electrical properties of Ni films deposited on polyimide by ion beam-assisted deposition (IBAD)

Published:2012-08-03 Issue:3 Volume:45 Page:691-697
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Xu Jun¹,Shao Tianmin¹

Affiliation:

1. State Key Laboratory of Tribology; Tsinghua University; Beijing; 100084; P.R. China

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference35 articles.

1. A Flexible Flow Sensor System and Its Characteristics for Fluid Mechanics Measurements

2. Properties of nickel thin films on polyimide substrata for HF bolometers

3. EPMA and XRD study on nickel metal thin film for temperature sensor

4. The influence of growth parameters on the optical properties and morphology of UHV deposited Ni thin films

5. Effect of deposition rate and thickness on the structural and electrical properties of evaporated Ni/glass and Ni/Si(100) thin films

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