Ambient atomic resolution atomic force microscopy with qPlus sensors: Part 1-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Ambient atomic resolution atomic force microscopy with qPlus sensors: Part 1

Published:2016-07-30 Issue:1 Volume:80 Page:50-65
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microsc. Res. Tech.

Author:

Wastl Daniel S.¹²

Affiliation:

1. Department of Nanobiotechnology; Institute for Biophysics, University of Natural Resources and Life Science; Muthgasse 11 Vienna 1190 Austria

2. Institute of Experimental and Applied Physics, University of Regensburg; Universitätsstrasse 31 Regensburg 93053 Germany

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/jemt.22730/fullpdf

Reference98 articles.

1. Frequency modulation detection using high-q cantilevers for enhanced force microscope sensitivity;Albrecht;Journal of Applied Physics,1991

2. How to measure energy dissipation in dynamic mode atomic force microscopy;Anczykowski;Applied Surface Science,1999

3. High-speed atomic force microscopy for studying the dynamic behavior of protein molecules at work;Ando;Japanese Journal of Applied Physics,2006

4. Dynamic SFM with true atomic resolution on alkali halide surfaces;Bammerlin;Applied Physics A Materials Science & Processing,1998

5. Scanning tunneling microscopy;Binnig;Surface Science,1985

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Next-Generation qPlus-Sensor-Based AFM Setup: Resolving Archaeal S-Layer Protein Structures in Air and Liquid;The Journal of Physical Chemistry B;2023-08-01

2. Atomic resolution with high-eigenmode tapping mode atomic force microscopy;Physical Review Research;2022-05-24

3. Preparation of Octadecyltrichlorosilane Nanopatterns Using Particle Lithography: An Atomic Force Microscopy Laboratory;Journal of Chemical Education;2017-12-29

4. Patterning of supported gold monolayers via chemical lift-off lithography;Beilstein Journal of Nanotechnology;2017-12-08

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3