Investigation of stress, defect structure and electrical conduction in large diameter III-nitride epitaxy on silicon substrates
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Published:2015-03-18
Issue:4-5
Volume:12
Page:418-422
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ISSN:1862-6351
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Container-title:physica status solidi (c)
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language:en
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Short-container-title:Phys. Status Solidi C
Author:
Chung G.,Loboda M. J.,Carlson E.,Ewoldt D.,Ng T.,Shepherd D.
Subject
Condensed Matter Physics