Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM‐Tomography-Reference-Cited by-同舟云学术

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Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM‐Tomography

Published:2017-11-06 Issue:12 Volume:14 Page:1700216
ISSN:1862-6351
Container-title:physica status solidi c
language:en
Short-container-title:physica status solidi c

Author:

Hiller Daniel¹^ORCID,Gutsch Sebastian¹,López‐Vidrier Julian¹,Zacharias Margit¹,Estradé Sònia²³,Peiró Francesca²³,Cruz‐Matías Irving⁴,Ayala Dolors⁵

Affiliation:

1. Laboratory for Nanotechnology Department of Microsystems Engineering (IMTEK) University of FreiburgFreiburgGermany

2. LENS‐MIND Laboratory of Electron Nanoscopy Electronics Department University of BarcelonaBarcelonaSpain

3. Institute of Nanoscience and Nanotechnology In2UB University of BarcelonaBarcelonaSpain

4. Computer Science Department University of MonterreyMonterreyMexico

5. Computer Science Department Polytechnical University of CataloniaBarcelonaSpain

Publisher

Wiley

Subject

Condensed Matter Physics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.201700216

Reference29 articles.

1. An All-Gas-Phase Approach for the Fabrication of Silicon Nanocrystal Light-Emitting Devices

2. Multicolor Silicon Light-Emitting Diodes (SiLEDs)

3. Detection of nitroaromatics in the solid, solution, and vapor phases using silicon quantum dot sensors

4. Solution Synthesis, Optical Properties, and Bioimaging Applications of Silicon Nanocrystals

5. Size-controlled highly luminescent silicon nanocrystals: A SiO/SiO2 superlattice approach

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Polarized luminescence of silicon nanoparticles formed in (SiOx–SiOy)n superlattice;Applied Nanoscience;2021-02-01

2. Sphericity and roundness computation for particles using the extreme vertices model;Journal of Computational Science;2019-01

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