83‐2: Reliability Characterization of Luminance Degradation of OLED Mobile Display Considering Color Difference Index Based on Usage Patterns-Reference-Cited by-同舟云学术

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83‐2: Reliability Characterization of Luminance Degradation of OLED Mobile Display Considering Color Difference Index Based on Usage Patterns

Published:2020-08 Issue:1 Volume:51 Page:1251-1254
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:SID Symposium Digest of Technical Papers

Author:

Kim Heejin¹,Choi Yoonsuk¹,Kim Sangkil¹,Chung Sam¹,Park Jongwoo¹

Affiliation:

1. Technology Quality Reliability Samsung Display CO. LTD. Samsung-ro, Giheung Yongin Gyeonggi-do 17113 Korea

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.14106

Reference13 articles.

1. Image quality affected by diffraction of aperture structure arrangement in transparent active-matrix organic light-emitting diode displays

2. OLED lifetime issues from a mobile-phone-industry point of view

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Lifetime measurement and aging mechanism analysis of OLED subpixels;Displays;2022-12

2. Preferable Parametric Model for the Lifetime of the Organic Light-Emitting Diode Under Accelerated Current Stress Tests;IEEE Transactions on Electron Devices;2021-09

3. Operando sum‐frequency generation spectroscopy of high‐efficiency OLEDs for probing the charge carrier behavior;Journal of the Society for Information Display;2021-08-31

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