P‐36: Highly Reliable a‐IGZO TFT Gate Driver Circuit to Prevent Leakage Path in Depletion Mode Operation-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

P‐36: Highly Reliable a‐IGZO TFT Gate Driver Circuit to Prevent Leakage Path in Depletion Mode Operation

Published:2020-08 Issue:1 Volume:51 Page:1486-1489
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:SID Symposium Digest of Technical Papers

Author:

Lee Jungwoo¹,Oh Jongsu¹,Jung Eun Kyo¹,Park KeeChan²,Lee Soo-Yeon³,Kim Yong-Sang¹

Affiliation:

1. Department of Electrical and Computer Engineering Sungkyunkwan University Suwon 16419 Korea

2. Department of Electronics Engineering Konkuk University Seoul 05029 Korea

3. Department of Electrical and Computer Engineering Seoul National University Seoul 08826 Korea

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.14168

Reference9 articles.

1. Oxide-TFT technologies for next-generation AMOLED displays

2. 68.3:Invited Paper: Transparent Amorphous Oxide Semiconductors for High Performance TFT

3. IGZO TFT gate driver circuit with large threshold voltage margin

4. A novel gate driver circuit for depletion‐mode a‐IGZO TFTs

5. Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP