An Analytical Model of Light Scattering by Birefringent Polycrystalline Dielectrics Using Perturbation of Maxwell's Equations

Abstract

AbstractPolycrystalline materials have shown promise in advanced optical applications because of their unique optical and mechanical properties. Most polycrystalline materials have non‐uniform optical properties due to residual porosity, secondary phases, and/or crystalline anisotropies (e.g., birefringence). These optical inhomogeneities manifest as scattering that reduces the transparency of the polycrystal. Even in the case of a single‐phase polycrystal with negligible porosity, birefringence scattering will always be present whenever the crystal is anisotropic (non‐cubic). Multiple models for predicting birefringence scattering have been suggested in the literature that are successful in describing scattering loss in specific material systems. Here a first‐principles model of birefringent scattering that is applicable to any single‐phase, unaligned transparent polycrystal is derived. The model can treat grain size distributions and is not limited to a specific material system. The derivation culminates in an equation that describes birefringence scattering coefficient spectra using the single‐crystal refractive index tensor and chord length distribution (measured from a representative polished surface micrograph). The model should be useful for designing materials and characterization. For example, it can be used to predict transmissions of transparent polycrystals for a range of grain sizes or to characterize the average grain size using a transmission measurement.