Optimal design of fatigue life for RCP with PoP package by using the Taguchi method
Author:
Affiliation:
1. Department of Engineering Science; National Cheng Kung University; Tainan 701 Taiwan, ROC
2. Technical Development Department; NXP Semiconductors Taiwan; 811 Kaohsiung City Taiwan, ROC
Funder
National Science Council of Taiwan, R.O.C.
Publisher
Wiley
Subject
Electrical and Electronic Engineering,Computer Science Applications,Modeling and Simulation
Reference23 articles.
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3. Yoshida A. Taniguchi J Murata K Kada M Yamamoto Y Takagi Y Notomi T Fjita A. A study on package stacking process for package-on-package (PoP) roceedings of the 56th International Conference of the IEEE Electronic Components and Technology Conference 2006 825 830 10.1109/ECTC.2006.1645753
4. Keser B Amrine C Trung D Fay O Hayes S Leal G Lytle W Mitchell D Wenzel R The Redistributed Chip Package: A Breakthrough for Advanced Packaging Proceedings of the 57th International Conference of the IEEE Electronic Components and Technology Conference 2007 286 291 10.1109/ECTC.2007.373811
5. Ramanathan LN Keser B Amrine C Duong T Hayes S Leal G Mangrum M Mitchell D Wenzel R Implementation of a Mobile Phone Module with Redistributed Chip Packaging Proceedings of the 58th International Conference of the IEEE Electronic Components and Technology Conference 2008 1117 1120 10.1109/ECTC.2008.4550115
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