A study of the effect of transient stresses on the fatigue life of RF MEMS switches-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A study of the effect of transient stresses on the fatigue life of RF MEMS switches

Published:2019-02-15 Issue:3 Volume:32 Page:e2570
ISSN:0894-3370
Container-title:International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
language:en
Short-container-title:Int J Numer Model

Author:

Xi Wei¹,Elsinawi Ameen¹^ORCID,Guha Koushik²^ORCID,Karumuri Srinivasa Rao³^ORCID,Shaikh‐Ahmad Jamal¹

Affiliation:

1. Mechanical Engineering DepartmentKhalifa University Abu Dhabi United Arab Emirates

2. National MEMS Design Centre (NMDC)National Institute of Technology Silchar Silchar India

3. Microelectronics Research Group, Department of ECEKL University Guntur India

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modeling and Simulation

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jnm.2570

Reference41 articles.

1. Reliability research on micro- and nano-electromechanical systems: a review

2. Research Reviews and Prospects of MEMS Reliability

3. MEMS reliability from a failure mechanisms perspective

4. Thermal fatigue life estimation and delamination mechanics studies of multilayered MEMS structures

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comprehensive Review of RF MEMS Switches in Satellite Communications;Sensors;2024-05-15

2. Global Bifurcation Behaviors and Control in a Class of Bilateral MEMS Resonators;Fractal and Fractional;2022-09-23

3. Fatigue-induced dynamic pull-in instability in electrically actuated microbeam resonators;International Journal of Mechanical Sciences;2021-04

4. Comparative investigations of multi-fidelity modeling on performance of electrostatically-actuated cracked micro-beams;International Journal of Mechanical Sciences;2021-02

5. Research Status and Development Trend of MEMS Switches: A Review;Micromachines;2020-07-17

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3