A simplified cascade‐based de‐embedding technique for on‐wafer microwave characterization of thin‐film resistors and transmission lines-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A simplified cascade‐based de‐embedding technique for on‐wafer microwave characterization of thin‐film resistors and transmission lines

Published:2021-07-17 Issue:11 Volume:63 Page:2791-2796
ISSN:0895-2477
Container-title:Microwave and Optical Technology Letters
language:en
Short-container-title:Microw Opt Technol Lett

Author:

Wei Zhennan¹,Huang Fengyi¹^ORCID,Tang Xusheng¹,Jiang Nan²

Affiliation:

1. School of Information Science and Engineering Southeast University Nanjing China

2. RFIC Deptartment, S‐TEK Research Center Shanghai China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/mop.32977

Reference12 articles.

1. An improved de‐embedding technique for on‐wafer high‐frequency characterization;Koolen MCAM;Proc Bipolar Circuits Technol Meet,1991

2. A Novel Transmission-Line Deembedding Technique for RF Device Characterization

3. Effect of Substrate Parasitic Inductance on Silicon-Based Transmission Lines and On-Chip Inductors

4. Characteristic-function approach to parameter extraction for asymmetric equivalent circuit of on-chip spiral inductors

5. An Improved Cascade-Based Noise Deembedding Method for On-Wafer Noise Parameter Measurements

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP