Drivers for the cracking of multilayer polyamide‐based backsheets in field photovoltaic modules: In‐depth degradation mapping analysis

Author:

Lyu Yadong1ORCID,Fairbrother Andrew1,Gong Mengyan1,Kim Jae Hyun1,Hauser Adam2ORCID,O'Brien Greg2,Gu Xiaohong1ORCID

Affiliation:

1. Engineering Laboratory National Institute of Standards and Technology (NIST) Gaithersburg MD 20899 USA

2. Fluoropolymers R&D Arkema King of Prussia PA 19406 USA

Funder

U.S. Department of Energy

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference65 articles.

1. Relation between degradation of polymeric components in crystalline silicon PV module and climatic conditions: A literature review

2. Correlation of the loss in photovoltaic module performance with the ageing behaviour of the backsheets used

3. Felder T.;Hu H.;Gambogi W.;Choudhury K.;MacMaster S.;Garreau‐lles L.;Trout T.Field study and analysis of backsheet degradation in 450MW + PV installations.2017.https://www.nist.gov/sites/default/files/documents/2018/01/09/felder-dupont_worldwide_field_inspection_results.pdf. (accessed on February 2020).

4. Gambogi W.Multistress accelerated testing and correlation to field performance.SNEC 12th (2018) International Photovoltaic Power Generation and Smart Energy Exhibition & Conference.2018.http://www.dupont.cn/content/dam/dupont/products-and-services/solar-photovoltaic-materials/solar-photovoltaic-materials-landing/documents/DEI-SNEC-2018-presentation-William-Gambogi.pdf. (accessed on February 2020).

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