A Method for Measuring the Thickness of Thin Bent Foils in Transmission Electron Microscopy
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Zur prüfung der dynamischen theorie der elektronenbeugung am kristallgitter
2. Elektroneninterferenzen im konvergenten Bündel
3. The buckling of a thin plate due to the presence of an edge dislocation
4. Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin Sections
5. Effect of Inelastic Waves on Electron Diffraction
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