1. Transmission Electron Microscopy of Metals, John Wiley and Sons, Inc., New York 1962 (p. 273).
2. Slide Rule Method for Indexing Electron Diffraction Patterns
3. Fundamentals of Transmission Electron Microscopy, Interscience, Publishers, New York 1964.
4. The Direct Oservation of Dislocations, Academic Press, New York and London 1964.
5. Thin Films (ASM Seminar, Oct. 1963), ASM, 227 (1964).