Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Calibration and Use of an Electron Microscope for Precision Micromeasurements in Thin Film Materials
2. paper presented at a special symposium The Many Facets of Grain Boundaries, September 14 and 15, 1967, University of Florida, Gainesville (to be published).
3. Study of Erbium Thin Film Oxidation in the Electron Microscope
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12 articles.
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