Constructing Nano‐Interlayer Inhibiting Interfacial Degradation toward High‐Voltage PEO‐Based All‐Solid‐State Lithium Batteries

Author:

Zhai Pengfei1,Qu Shuangquan2,Ahmad Niaz13ORCID,Hua Ze2,Shao Ruiwen2ORCID,Yang Wen14ORCID

Affiliation:

1. Key Laboratory of Cluster Science of Ministry of Education Beijing Key Laboratory of Photoelectronic/Electrophotonic Conversion Materials School of Chemistry and Chemical Engineering Beijing Institute of Technology Beijing 100081 P. R. China

2. Beijing Advanced Innovation Center for Intelligent Robots and Systems Institute of Engineering Medicine Beijing Institute of Technology Beijing 100081 P. R. China

3. School of Chemistry and Chemical Engineering Key Laboratory of Ministry of Education for Advanced Materials in Tropical Island Resources Collaborative Innovation Center of Ecological Civilization Hainan University No 58, Renmin Avenue Haikou 570228 P. R. China

4. A power Electronics Co., Ltd 8 Jinghu Road, Xinya Street, Huadu District Guangzhou 510800 China

Abstract

AbstractThe interfacial instability between PEO‐based solid electrolyte (SPE) and high‐voltage cathode materials inhibits the longevity of high‐energy‐density all‐solid‐state polymer lithium metal batteries (ASSPLBs). Herein, for the first time it is demonstrated, that contact loss caused by gas generation from interfacial side reactions between the high‐voltage cathode and solid polymer electrolyte (SPE) can also arise in ASSPLBs. To alleviate the interfacial side reactions, a LiNb0.6Ti0.5O3 (LNTO) layer is well coated on LiNi0.83Co0.07Mn0.1O2 (NCM83), denoted as (CNCM83). The LNTO layer with low electronic conductivity reduces the decomposition drive force of SPE. Furthermore, Ti and Nb in the LNTO layer spontaneously migrate inside the NCM83 surface to form a strong Ti/Nb─O bond, stalling oxygen evolution in high‐voltage cathodes. The interfacial degradation phenomena, including SPE decomposition, detrimental phase transition and intragranular cracks of NCM83, and void formation between cathode and SPE, are effectively mitigated by the LNTO layer. Therefore, the growth rate of interfacial resistance (RCEI) decreases from 37.6 Ω h−0.5 for bare NCM83 to 2.4 Ω h−0.5 for CNCM83 at 4.2 V. Moreover, 4.2 V PEO‐based ASSPLBs achieve impressive cyclability with high capacity retention of 135 mAh g−1 (75%) even after 300 cycles at 0.5 C.

Funder

National Natural Science Foundation of China

Publisher

Wiley

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3