Suppression of Thermally Induced Surface Traps in Colloidal Quantum Dot Solids via Ultrafast Pulsed Light

Author:

Lee Eon Ji1,Lee Wonjong2,Yun Tae Ho3,You Hyung Ryul1,Kim Hae Jeong1,Yu Han Na1,Kim Soo‐Kwan1,Kim Younghoon4,Ahn Hyungju5,Lim Jongchul2,Yim Changyong678,Choi Jongmin1ORCID

Affiliation:

1. Department of Energy Science and Engineering Daegu Gyeongbuk Institute of Science and Technology (DGIST) 333 Techno Jungang‐Daero, Hyeonpung‐Eup, Dalseong‐Gun Daegu 42988 Republic of Korea

2. Graduate School of Energy Science and Technology Chungnam National University (CNU) 99, Daehak‐ro, Yuseong‐gu Daejeon 34134 Republic of Korea

3. Department of Precision Mechanical Engineering Kyungpook National University (KNU) 2559 Gyeongsang‐daero Sangju‐si Gyeongbuk 37224 Republic of Korea

4. Department of Applied Chemistry Kookmin University (KMU) Seoul 02707 Republic of Korea

5. Pohang Accelerator Laboratory (PAL) 80, Jigok‐ro 127 beon‐gil, Nam‐gu, Gyeongsangbuk‐do Pohang‐si 37673 Republic of Korea

6. Department of Energy Chemical Engineering Kyungpook National University (KNU) 2559 Gyeongsang‐daero Sangju‐si Gyeongbuk 37224 Republic of Korea

7. Convergence Research Center of Mechanical and Chemical Engineering (CRCMCE) Kyungpook National University (KNU) 2559 Gyeongsang‐daero Sangju‐si Gyeongbuk 37224 Republic of Korea

8. Department of Advanced Science and Technology Convergence Kyungpook National University (KNU) 2559 Gyeongsang‐daero Sangju‐si Gyeongbuk 37224 Republic of Korea

Abstract

AbstractThermal annealing (TA) of colloidal quantum dot (CQD) films is considered an important process for recent high‐performing CQD solar cells (SCs) due to its beneficial effects on CQD solids, including enhanced electrical conductivity, denser packing of CQD films, and the removal of organic residues and solvents. However, the conventional TA for CQDs, which requires several  minutes, leads to hydroxylation and oxidation on the CQD surface, resulting in the formation of trap states and a subsequent decline in SC performance. To address these challenges, this study introduces a flashlight annealing (FLA) technique that significantly reduces the annealing time to the millisecond scale. Through the FLA approach, it successfully suppressed hydroxylation and oxidation, resulting in decreased trap states within the CQD solids while simultaneously preserving their charge transport properties. As a result, CQD SCs treated with FLA exhibited a notable improvement, achieving an open‐circuit voltage of 0.66 V compared to 0.63 V in TA‐treated devices, leading to an increase in power conversion efficiency from 12.71% to 13.50%.

Funder

National Research Foundation

Publisher

Wiley

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