Achieving Ideal and Environmentally Stable n‐Type Charge Transport in Polymer Field‐Effect Transistors

Abstract

AbstractRealizing ideal charge transport in field‐effect transistors (FETs) of conjugated polymers is crucial for evaluating device performance, such as carrier mobility and practical applications of conjugated polymers. However, the current FETs using conjugated polymers as the active layers generally show certain non‐ideal transport characteristics and poor stability. Here, ideal charge transport of n‐type polymer FETs is achieved on flexible polyimide substrates by using an organic‐inorganic hybrid double‐layer dielectric. Deposited conjugated polymer films show highly ordered structures and low disorder, which are supported by grazing‐incidence wide‐angle X‐ray scattering, near‐edge X‐ray absorption fine structure, and molecular dynamics simulations. Furthermore, the organic‐inorganic hybrid double‐layer dielectric provides low interfacial defects, leading to excellent charge transport in FETs with high electron mobility (1.49 ± 0.46 cm2 V−1 s−1) and ideal reliability factors (102 ± 7%). Fabricated polymer FETs show a self‐encapsulation effect, resulting in high stability of the FET charge transport. The polymer FETs still work with high mobility above 1 cm2 V−1 s−1 after storage in air for more than 300 days. Compared with state‐of‐the‐art conjugated polymer FETs, this work simultaneously achieves ideal charge transport and environmental stability in n‐type polymer FETs, facilitating rapid device optimization of high‐performance polymer electronics.