Auger quantitative analysis of brass via target factor analysis-Reference-Cited by-同舟云学术

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Auger quantitative analysis of brass via target factor analysis

Published:1994-08 Issue:8 Volume:21 Page:571-575
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Calliari L.,Gonzo L.,Micheli V.,Tiscione P.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference15 articles.

1. Ion induced surface compositional changes of α brass; a comparative study by AES and sputtered thermal ion mass spectrometry. Application to quantitative AES

2. Auger quantitative analysis and preferential sputtering in brass alloys

3. Bombardment-induced segregation of Cu in Pt-Cu alloy observed using different energy Auger line combinations

4. Electron irradiation of silicon dioxide: a non-destructive measurement of the in-depth induced compositional changes

5. Principal component analysis of Auger line shapes at solid—solid interfaces

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1. A mechanistic study of stratified patina evolution on Sn-bronze in chloride-rich atmospheres;Corrosion Science;2020-04

2. Conduction type of nonstoichiometric alloy semiconductor CuxZnyS deposited by the photochemical deposition method;Thin Solid Films;2015-11

3. Quantitative analysis of sputtered α- and α+β-brass surfaces by using Auger electron spectroscopy with principal component analysis-target factor analysis;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1999-05

4. Multi-imaging and multivariate statistics used for 3D characterization at surfaces;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;1996-11-15

5. Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy;Analytical Chemistry;1996-01-01

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