An examination of the use of principal component analysis and target factor analysis for the determination of Auger depth profiles in two magnetic multilayer metal systems

An examination of the use of principal component analysis and target factor analysis for the determination of Auger depth profiles in two magnetic multilayer metal systems—Cu/Co and Co/Pt

Published:1995-12 Issue:13 Volume:23 Page:858-872
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Wenham M. J. G.,Barkshire I. R.,Prutton M.,Roberts R. H.,Wilkinson D. K.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

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5. Principal component analysis for refractory metal silicide investigations with auger electron spectroscopy

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