Scanning tunnelling microscope studies of sputtering

Author:

Wilson Ian H.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Surface tracks on ultra-thin polymer films;physica status solidi (c);2013-03-11

2. Relaxation of surface tracks on polycarbonate thin films induced by MeV heavy-ion impacts;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-10

3. Direct Evidence for Projectile Charge-State Dependent Crater Formation Due to Fast Ions;Physical Review Letters;2008-10-16

4. Single ion impacts on an In0.22Ga0.78As/GaAs(100) surface observed by atomic force microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-05

5. Ion Impacts and Nanostructures on Ge(111), In0.22Ga0.78As/GaAs(100) and Alpha Quartz Surfaces Observed by Atomic Force Microscopy;Surface and Interface Analysis;1996-12

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