Enhancements in full-field PIXE imaging-Large area elemental mapping with increased lateral resolution devoid of optics artefacts-Reference-Cited by-同舟云学术

Enhancements in full-field PIXE imaging-Large area elemental mapping with increased lateral resolution devoid of optics artefacts

Published:2018-05-20 Issue:4 Volume:47 Page:327-338
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrometry

Author:

Buchriegler Josef¹^ORCID,Klingner Nico¹^ORCID,Hanf Daniel¹,Munnik Frans¹^ORCID,Nowak Stanisław H.²³^ORCID,Scharf Oliver²,Ziegenrücker René⁴^ORCID,Renno Axel D.⁴^ORCID,Borany Johannes von¹

Affiliation:

1. Helmholtz-Zentrum Dresden-Rossendorf; Institute of ion Beam Physics and Materials Research; 01328 Dresden Germany

2. Helmut Fischer GmbH, Institut für Elektronik und Messtechnik; 12489 Berlin Germany

3. Stanford Synchrotron Radiation Lightsource; 2575 Sand Hill Road, MS 69 Menlo Park CA 94025 USA

4. Helmholtz-Zentrum Dresden-Rossendorf; Helmholtz Institute Freiberg for Resource Technology; 01328 Dresden Germany

Publisher

Wiley

Subject

Spectroscopy

Reference26 articles.

1. X-ray fluorescence imaging with pixel detectors

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4. Compact pnCCD-Based X-ray Camera with High Spatial and Energy Resolution: A Color X-ray Camera

5. Micro X-ray Fluorescence Imaging in a Tabletop Full Field-X-ray Fluorescence Instrument and in a Full Field-Particle Induced X-ray Emission End Station

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1. BAMline—A real-life sample materials research beamline;The Journal of Chemical Physics;2023-06-23

2. Comparison of three reconstruction methods based on deconvolution, iterative algorithm and neural network for X-ray fluorescence imaging with coded aperture optics;Journal of Analytical Atomic Spectrometry;2020