Morphology, microstructure, and doping behaviour: A comparison between different deposition methods for poly‐Si/SiO x passivating contacts-Reference-Cited by-同舟云学术

Morphology, microstructure, and doping behaviour: A comparison between different deposition methods for poly‐Si/SiO x passivating contacts

Published:2021-03-04 Issue: Volume: Page:
ISSN:1062-7995
Container-title:Progress in Photovoltaics: Research and Applications
language:en
Short-container-title:Prog Photovolt Res Appl

Author:

Truong Thien N.¹^ORCID,Yan Di²,Nguyen Cam‐Phu T.³,Kho Teng¹,Guthrey Harvey⁴^ORCID,Seidel Jan³,Al‐Jassim Mowafak⁴,Cuevas Andres¹,Macdonald Daniel¹,Nguyen Hieu T.¹^ORCID

Affiliation:

1. School of Engineering The Australian National University Canberra ACT Australia

2. Department of Electrical and Electronic Engineering The University of Melbourne Melbourne Victoria Australia

3. School of Materials Science and Engineering The University of New South Wales Sydney NSW Australia

4. National Renewable Energy Laboratory Golden Colorado USA

Funder

Australian Centre for Advanced Photovoltaics

Australian Renewable Energy Agency

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pip.3411

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4. High efficiency n‐type silicon solar cells with passivating contacts based on PECVD silicon films doped by phosphorus diffusion;Yan D;Sol Energy Mater Sol Cells,2019

5. Tunnel oxide passivated contacts as an alternative to partial rear contacts;Feldmann F;Sol Energy Mater Sol Cells,2014

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