P-47: Algorithm for Regional Mura Reduction By Using Gamma-Curve Transformation in LCD Panels

Author:

Hu Hou-Liang1,Chu Li-Wei1,Kuo Ping-Sheng1,Lien Alan2

Affiliation:

1. Shenzhen China Star Optoelectronics Technology Co., Ltd, Guangdong, China

2. TCL Corporate Research, Guangdong, China

Publisher

Wiley

Reference7 articles.

1. Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection;Li;IEEE Transactions on industrial information,2011

2. A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method;Bi;IEEE Signal processing letters,2009

3. The Detection Using Human Visual system and Wavelet Transform in TFT-LCD Image;Oh;IEEE Computer Society,2007

4. Mura Grade Evaluation Based on SCIELAB Color System;Asano;SID,2014

5. The effects of a visual fidelity criterion on the encoding of images;Mannos;IEEE Transactions on Information Theory,1974

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. An Efficient Optical Mura Compensation System for Large Liquid-Crystal Display Panels;IEEE Transactions on Instrumentation and Measurement;2022

2. 78‐2: Measurement and Evaluation of Subpixel Brightness for Demura;SID Symposium Digest of Technical Papers;2019-05-29

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