Patent overlay mapping: Visualizing technological distance-Reference-Cited by-同舟云学术

Patent overlay mapping: Visualizing technological distance

Published:2014-05-07 Issue:12 Volume:65 Page:2432-2443
ISSN:2330-1635
Container-title:Journal of the Association for Information Science and Technology
language:en
Short-container-title:J Assn Inf Sci Tec

Author:

Kay Luciano¹,Newman Nils²,Youtie Jan³,Porter Alan L.⁴⁵,Rafols Ismael⁶⁷

Affiliation:

1. Center for Nanotechnology in Society; University of California Santa Barbara; 2327 Girvetz Hall Santa Barbara CA 93106-2150

2. Intelligent Information Services Corporation; P.O. Box 77691 Atlanta GA 30357

3. Enterprise Innovation Institute & School of Public Policy; 75 Fifth Street NW, Suite 300 Atlanta GA 30308

4. School of Public Policy; Georgia Institute of Technology; Atlanta GA

5. Search Technologies; Atlanta GA 30332-0345

6. Ingenio (CSIC-UPV); Universitat Politècnica de València; CPI, 8E 4rt, Accés J, Camí de Vera s/n València 46022 Spain

7. SPRU - Science and Technology Policy Research; University of Sussex; Brighton UK

Funder

National Science Foundation

Publisher

Wiley

Subject

Library and Information Sciences,Information Systems and Management,Computer Networks and Communications,Information Systems

Link

Reference29 articles.

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