Discriminant diffusion maps based k -nearest-neighbour for batch process fault detection
Author:
Affiliation:
1. Information Engineering School; Shenyang University of Chemical Technology; Shenyang, 110142 P. R. China
2. College of Information Science and Engineering; Northeastern University; Shenyang, 110142 P. R. China
Funder
National Natural Science Foundation of China
Laboratory Foundation of Liaoning Provincial Education Department of China
Publisher
Wiley
Subject
General Chemical Engineering
Reference29 articles.
1. On the "dimensionality curse" and the "self-similarity blessing"
2. Stage-based soft-transition multiple PCA modeling and on-line monitoring strategy for batch processes
3. Diffusion maps based k-nearest-neighbor rule technique for semiconductor manufacturing process fault detection
4. Two-step principal component analysis for dynamic processes monitoring
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