Microscopic Theory of Tensosensibility of Multi-Layer Polycrystalline Films-Reference-Cited by-同舟云学术

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Microscopic Theory of Tensosensibility of Multi-Layer Polycrystalline Films

Published:2000-03 Issue:3 Volume:35 Page:329-332
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Cryst. Res. Technol.

Author:

Lasyuchenko O.,Odnodvoretz L.,Protsenko I.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference4 articles.

1. , phys. stat. sol. 1988.

2. , Phys. Metals 1995.

3. , , Metallofizika i noveishie tehnologii 1998.

4. , , J.Mater.Sci. 1981.

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2. Future Strain Properties of Multilayer Film Materials;Springer Proceedings in Physics;2014-08-12

3. Tensoresistive effect in thin metal films in the range of elastic and plastic strain;Technical Physics;2011-02

4. Electrophysical properties of Ni/V and Cr/Fe multilayer films;Crystal Research and Technology;2009-01

5. Effect of the Tensosensitivity in Metal Film Materials;Uspehi Fiziki Metallov;2007-06-01

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