Efficiency Optimization of Ge‐V Quantum Emitters in Single‐Crystal Diamond upon Ion Implantation and HPHT Annealing

Abstract

AbstractThe authors report on the characterization at the single‐defect level of germanium‐vacancy (GeV) centers in diamond produced upon Ge− ion implantation and different subsequent annealing processes, with a specific focus on the effect of high‐pressure‐high‐temperature (HPHT) processing on their quantum‐optical properties. Different post‐implantation annealing conditions are explored for the optimal activation of GeV centers, namely, 900 °C 2 h, 1000 °C 10 h, 1500 °C 1 h under high vacuum, and 2000 °C 15 min at 6 GPa pressure. A systematic analysis of the relevant emission properties, including the emission intensity in saturation regime and the excited state radiative lifetime, is performed on the basis of a set of ion‐implanted samples, with the scope of identifying the most suitable conditions for the creation of GeV centers with optimal quantum‐optical emission properties. The main performance parameter adopted here to describe the excitation efficiency of GeV centers as single‐photon emitters is the ratio between the saturation optical excitation power and the emission intensity at saturation. The results show an up to eightfold emission efficiency increase in HPHT‐treated samples with respect to conventional annealing in vacuum conditions, suggesting a suitable thermodynamic pathway toward the repeatable fabrication of ultra‐bright GeV centers for single‐photon generation purposes.