Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy-Reference-Cited by-同舟云学术

Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy

Published:2020-07-29 Issue:17 Volume:7 Page:1901391
ISSN:2198-3844
Container-title:Advanced Science
language:en
Short-container-title:Adv. Sci.

Author:

Kwon Owoong¹,Seol Daehee¹,Qiao Huimin¹,Kim Yunseok¹^ORCID

Affiliation:

1. School of Advanced Materials and Engineering & Research Center for Advanced Materials Technology Sungkyunkwan University (SKKU) Suwon 16419 Republic of Korea

Funder

National Research Foundation of Korea

Ministry of Education

Publisher

Wiley

Subject

General Physics and Astronomy,General Engineering,Biochemistry, Genetics and Molecular Biology (miscellaneous),General Materials Science,General Chemical Engineering,Medicine (miscellaneous)

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/advs.201901391

Reference178 articles.

1. Ferroelectric tunnel junctions for information storage and processing

2. Ferroelectric thin films: Review of materials, properties, and applications

3. Ferroelectric thin films for micro-sensors and actuators: a review

4. Giant electric-field-induced strains in lead-free ceramics for actuator applications – status and perspective

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