Understanding Strain‐Induced Phase Transformations in BiFeO 3 Thin Films-Reference-Cited by-同舟云学术

Understanding Strain‐Induced Phase Transformations in BiFeO 3 Thin Films

Published:2015-05-28 Issue:8 Volume:2 Page:1500041
ISSN:2198-3844
Container-title:Advanced Science
language:en
Short-container-title:Adv. Sci.

Author:

Dixit Hemant¹,Beekman Christianne¹,Schlepütz Christian M.²,Siemons Wolter¹,Yang Yongsoo³,Senabulya Nancy³,Clarke Roy³,Chi Miaofang⁴,Christen Hans M.⁴,Cooper Valentino R.¹

Affiliation:

1. Materials Science and Technology Division Oak Ridge National Lab Oak Ridge TN 37831 USA

2. Advanced Photon Source Argonne National Laboratory Argonne IL 60439 USA

3. Department of Physics University of Michigan Ann Arbor MI 48109 USA

4. Center for Nanophase Materials Sciences Oak Ridge National Lab Oak Ridge TN 37830 USA

Funder

Basic Energy Sciences

Office of Science

U.S. Department of Energy

Publisher

Wiley

Subject

General Physics and Astronomy,General Engineering,Biochemistry, Genetics and Molecular Biology (miscellaneous),General Materials Science,General Chemical Engineering,Medicine (miscellaneous)

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/advs.201500041

Reference37 articles.

1. Dielectric hysteresis in single crystal BiFeO3

2. The atomic structure of BiFeO3

3. Structure of a ferroelectric and ferroelastic monodomain crystal of the perovskite BiFeO3

4. Physics and Applications of Bismuth Ferrite

5. N.B. in literature different notations such asR′ orR‐like are used to distinguish the monoclinic nearly rhombohedral structure observed in the thin films from the actual rhombohedral ground state; however as the structural parameters of theR′ films depend on film thickness we will here focus on the rhombohedral ground state (R) for clarity.

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