A control chart based on likelihood ratio test for monitoring process mean and variability
Author:
Funder
NSF of Tianjin
NNSF of China
Publisher
Wiley
Subject
Management Science and Operations Research,Safety, Risk, Reliability and Quality
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/qre.1036/fullpdf
Reference19 articles.
1. Econometric statistical control chart design with an application to x̄ and R control charts;Saniga;Technometrics,1989
2. Determination of optimal design parameters of joint x̄ and R charts;Rahim;Journal of Quality Technology,1989
3. Joint econometric design of x̄ and R control charts for processes subject to two independent assignable causes;Costa;IIE Transactions,1993
4. Joint economic design of x̄ and R charts under Weibull shock models;Rahim;International Journal of Production Research,2000
5. Joint monitoring of process mean and variance using exponentially weighted moving average control charts;Gan;Technometrics,1995
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