The influence of eyespot resistance genes on baking quality and yield in wheat-Reference-Cited by-同舟云学术

The influence of eyespot resistance genes on baking quality and yield in wheat

Published:2002 Issue:13 Volume:82 Page:1537-1540
ISSN:0022-5142
Container-title:Journal of the Science of Food and Agriculture
language:en
Short-container-title:J. Sci. Food Agric.

Author:

Koen Elizma,Labuschagne Maryke T,Viljoen Chris D

Publisher

Wiley

Subject

Nutrition and Dietetics,Agronomy and Crop Science,Food Science,Biotechnology

Reference17 articles.

1. AGRONOMIC AND QUALITY CHARACTERISTICS OF WHEAT LINES WITH LEAF RUST RESISTANCE DERIVED FROM TRITICUM SPELTOIDES

2. The degree of phenotypic resemblance of the near-isogenic lines of the wheat cultivar thatcher with their recurrent parent

3. and Grain yields of near-isogenic lines with added genes for stem rust resistance, in Proceedings of the International Wheat Genetics Symposium, Ed by and Institute for Plant Science Research, Cambridge. pp 901-906 (1988).

4. MUTATION OF A GENE FOR YELLOW PIGMENT LINKED TO Lr19 IN WHEAT

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