Imaging polymer interfaces at high resolution with electron microscopy: Perspective, challenges, and opportunities

Abstract

AbstractTransmission electron microscopy (TEM) has evolved into a powerful characterization tool that allows visualization of materials with finer resolution than any other type of microscope in existence. While numerous areas of the physical and biologically sciences and engineering benefit tremendously from TEM and its analytical features, the highest resolution can only be achieved if a sample fulfills certain requirements, including an optimal thickness as well as a sufficiently long e‐beam stability. At a fundamental level, the physical and chemical properties of organic polymers are generally problematic in conjunction with TEM, as they experience damage from the electron beam more readily than their hard materials counterparts. However, progress in polymer characterization using TEM has evolved considerably and the polymer community stands to benefit greatly from continued growth going forward.