Influence of the carrier diffusion process on the transient response of vertical-cavity surface-emitting lasers-Reference-Cited by-同舟云学术

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Influence of the carrier diffusion process on the transient response of vertical-cavity surface-emitting lasers

Published:2003-01 Issue:1 Volume:16 Page:29-39
ISSN:0894-3370
Container-title:International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
language:en
Short-container-title:Int. J. Numer. Model.

Author:

Torre M. S.,Ranea-Sandoval H. F.

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modelling and Simulation

Reference23 articles.

1. High-bit-rate data transmission with short-wavelength oxidized VCSELs, toward bias-free operation

2. Large area multitransverse-mode VCSELs for modal noise reduction in multimode fibre systems

3. Mode-coupling effects on the small-signal modulation of multitransverse-mode vertical-cavity semiconductor lasers

4. Limits of the modulation response of a single-mode proton implanted VCSEL

5. Modulation response of multiple transverse modes in vertical-cavity surface-emitting lasers

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Suppressing the turn-off-induced pulsations in VCSELs using an elevated oxide-layer structure;Optics Express;2010-01-11

2. Spatio-temporal emission dynamics of VCSELs: modal competition in the turn-on behavior;SPIE Proceedings;2004-09-01

3. Transverse dynamics in cavity nonlinear optics (2000–2003);Journal of Optics B: Quantum and Semiclassical Optics;2004-08-17

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