Comparative study on extraction methods of threshold voltage for thin‐film transistors-Reference-Cited by-同舟云学术

Comparative study on extraction methods of threshold voltage for thin‐film transistors

Published:2019-07-23 Issue:12 Volume:27 Page:816-821
ISSN:1071-0922
Container-title:Journal of the Society for Information Display
language:en
Short-container-title:J Soc Inf Display

Author:

Bai Ziheng¹²,Shi Xuewen²,Wang Jiawei²,Lu Nianduan²,Duan Xinlv²,Yang Guanhua²,Dong Chaofang¹,Xiao Kui¹^ORCID,Li Ling²

Affiliation:

1. Institute of Advanced Materials and TechnologyUniversity of Science and Technology Beijing China

2. Key Laboratory of Microelectronic Devices and Integrated TechnologyInstitute of Microelectronics of Chinese Academy of Sciences Beijing China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jsid.831

Reference22 articles.

1. AIP Adv;Huzaibi HU;Charge transport mechanism in low temperature polycrystalline silicon (LTPS) thin‐film transistors,2019

2. Phys. Status Solidi RRL;Chuai X;Optimization of Electrical Properties of MoS2 Field‐Effect Transistors by Dipole Layer Coulombic Interaction With Trap States.,2019

3. Microelectron Reliab;Ortiz‐Conde A;A review of recent MOSFET threshold voltage extraction methods,2002

4. Microelectron J;Siebel OF;MOSFET threshold voltage: Definition, extraction, and some applications.,2012

5. Solid State Electron;Hayama H;A new poly-silicon MOS transistor model which includes the effects of bulk trap states in grain boundary regions,1990

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ion-Doped Polyvinyl Alcohol (PVA)-Based Thin-Film Transistor for Logic Electronics and Neuronal Synapse;IEEE Transactions on Electron Devices;2024-06

2. A 121 A/cm² High Current Density Copolymer OSC-Based Thin-Film Power OFET With 300 V Off-State Breakdown Voltage;IEEE Journal of the Electron Devices Society;2023

3. A novel extraction method of device parameters for thin-film transistors (TFTs);Physics Letters A;2021-07