Error probability independent delay analysis of single electronics circuits-Reference-Cited by-同舟云学术

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Error probability independent delay analysis of single electronics circuits

Published:2017-08-25 Issue:2 Volume:46 Page:290-298
ISSN:0098-9886
Container-title:International Journal of Circuit Theory and Applications
language:en
Short-container-title:Int J Circ Theor Appl

Author:

Jain Amit¹^ORCID,Ghosh Arpita²,Dutta Pranab Kishore³,Singh N. Basanta⁴,Sarkar Subir Kumar⁵

Affiliation:

1. Department of Electronics and Communication Engineering; CMRIT; Bangalore 560037 India

2. Deptartment of Electronics and Communication Engineering; RCCIIT; Kolkata 700015 India

3. Department of Electronics and Communication Engineering; North Eastern Regional Institute of Science and Technology; Itanagar 791109 India

4. Department of Electronics and Communication Engineering, Manipur Institute of Technology; Manipur University; Imphal 795 004 India

5. Department of Electronics and Telecommunication Engineering; Jadavpur University; Kolkata 700032 India

Funder

University Grants Commission

Massachusetts Institute of Technology

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Single-electron devices and their applications;Likharev;Proc of the IEEE,1999

2. Single-electron transistor logic;Chen;Appl Phys Lett,1996

3. A new static differential design style for hybrid SET-CMOS logic circuits;Abutaleb;J Comput Electron,2015

4. I -V characteristics of two-dimensional nanodot-array single electron transistors;Mehrara;Superlatt Microstruct,2013

5. Analytical modeling of single electron transistor for hybrid CMOS-SET analog IC design;Mahapatra;IEEE Trans Electr Dev,2004

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