Author:
Tsutsumanova G. G.,Russev S. C.
Reference22 articles.
1. and , Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
2. , , , , and , Polarization Measurement, Analysis, and Applications V, , Editors, Proc. SPIE 4819, 157 (2002).
3. Quantum information processing and precise optical measurement with entangled-photon pairs
4. Standard Reference Material 2530 Series, National Institute of Standards and Technology, Gaithersburg, Md. 20899.
5. Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometers
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