Characterization of microstructure in amorphous and microcrystalline Si and related alloys by effusion of implanted helium
Author:
Affiliation:
1. Institut für Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Publisher
Wiley
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.200304325
Reference24 articles.
1. Evidence of Voids Within the As-Deposited Structure of Glassy Silicon
2. High-Resolution Electron Microscope Observation of Voids in Amorphous Ge
3. D. L.Williamson in: Properties of Amorphous Silicon and its Alloys T. Searle ed. (Inspec London UK 1998) p. 47.
4. A. H.Mahan in: Properties of Amorphous Silicon and its Alloys T. Searle ed. (Inspec London UK 1998) p. 39.
5. Diffusion and evolution of hydrogen in hydrogenated amorphous and microcrystalline silicon
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