Focused ion beam fabrication and properties of nanoscale Josephson junctions for sensors and other applications-Reference-Cited by-同舟云学术

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Focused ion beam fabrication and properties of nanoscale Josephson junctions for sensors and other applications

Published:2005-03 Issue:5 Volume:2 Page:1455-1462
ISSN:1610-1634
Container-title:physica status solidi (c)
language:en
Short-container-title:phys. stat. sol. (c)

Author:

Blamire M. G.¹,Bell C.²,Burnell G.²,Kang D.‐J.¹,Ruotolo A.³,Testa G.⁴

Affiliation:

1. Nanoscience Centre, University of Cambridge, 11 J.J. Thomson Ave. Cambridge CB3 0FF, UK

2. Department of Materials Science, Cambridge University, Pembroke St., Cambridge CB2 3QZ, UK

3. INFM and Dipartimento Scienze Fisiche, Università di Napoli Federico II, PiaDetectors and Sensors – Wide‐Gap Semiconductors and Superconductorsale Tecchio 80‐80125 Naples, Italy

4. Istituto di Cibernetica ‘E Caianiello’ del CNR, 80078 PoDetectors and Sensors – Wide‐Gap Semiconductors and Superconductorsuoli (Naples), Italy

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.200460826

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multiple-barrier and nanoscale superconducting devices;Superconductor Science and Technology;2006-02-15

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