Surface morphology analysis of HgI 2 and PbI 2 with interference microscopy – the challenges of measuring fragile materials and deep surface roughness-Reference-Cited by-同舟云学术

Surface morphology analysis of HgI 2 and PbI 2 with interference microscopy – the challenges of measuring fragile materials and deep surface roughness

Published:2003-02 Issue:3 Volume: Page:1044-1050
ISSN:1610-1634
Container-title:physica status solidi (c)
language:en
Short-container-title:phys. stat. sol. (c)

Author:

Montgomery P. C.¹,Ponpon J. P.¹,Sieskind M.¹,Draman C.²

Affiliation:

1. Laboratoire de Physique et Application des Semi‐conducteurs, C.N.R.S., 23 rue du Loess, BP 20 CR, 67037 Strasbourg Cedex 2, France

2. Laboratoire des Sciences de l'Image, de l'Informatique et de la Télédétection (LSIIT), CNRS, UPRES‐A 7005/ULP, Ecole Nationale Supérieure de Physique de Strasbourg, boulevard Sébastien Brant, 67400 Illkirch, France

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.200306236

Reference16 articles.

1. Influence of water and water vapour on the characteristics of KI treated HgI2 detectors

2. Surface effects of the HgI_2 crystal characterized by spectroscopic ellipsometry

3. Layer-by-layer etching of mercuric iodide crystals in the atomic force microscope

4. Photoetching effects in mercuric iodide

5. J. P.Fillard Near Field Optics and Nanoscopy (World Scientific Singapore 1996) pp. 197–214.

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