P-68: Analysis and Solution of Horizontal Line Defect Occurred During Reliability Test in 55' UD TFT-LCD TV with a-Si Integrated Gate Driver Technology
Author:
Affiliation:
1. China Star Optoelectronics Technology Co., Ltd; Shenzhen Guangdong China
Publisher
Wiley
Reference15 articles.
1. a-Si TFT Gate Driver Circuit Having Dual Pull-down Structure with Shared Node Controller;Cho;IDW Digest,2006
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