Secondary Ion Mass Spectrometry as a Surface Analysis Method for Hair, Skin, and Cosmetics-Reference-Cited by-同舟云学术

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Secondary Ion Mass Spectrometry as a Surface Analysis Method for Hair, Skin, and Cosmetics

Published:2021-03-05 Issue: Volume: Page:279-307
ISSN:
Container-title:Surface Science and Adhesion in Cosmetics
language:
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Author:

Biderman Norbert

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/9781119654926.ch9

Reference28 articles.

1. Secondary ion mass spectrometry (SIMS) – a powerful tool for studying mass transport over various length scales;De Souza R.;Phys. status solidi,2007

2. Applications of secondary ion mass spectrometry (SIMS) in materials science;McPhail D. S.;J. Mater. Sci.,2006

3. Introduction to Focused Ion Beams;Giannuzzi L.;Springer‐Verlag US,2005

4. Diffusion in Solids

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