Accumulation Layers-Reference-Cited by-同舟云学术

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Accumulation Layers

Published:2014-01-24 Issue: Volume: Page:1-8
ISSN:
Container-title:Wiley Encyclopedia of Electrical and Electronics Engineering
language:
Short-container-title:

Author:

Kuo Yue¹

Affiliation:

1. Thin Film Nano & Microelectronics Research Laboratory; Texas A&M University; College Station TX

Publisher

John Wiley & Sons, Inc.

Reference21 articles.

1. Photochemical quartz crystal microbalance study of the nanocrystalline titanium dioxide semiconductor electrode/water interface: Simultaneous photoaccumulation of electrons and protons;Lemon;J. Phys. Chem.,1996

2. The effect on polycrystalline ZnO film surfaces due to an Ar plasma introduced by a vacuum gauge;Zhang;Thin Solid Films,1995

3. Solution of the ZnO/p contact problem in a-Si:H solar cells;Kubon;Sol. Energy Mater. Sol. Cells,1996

4. Defect model of charge transfer doping at a-Si:NxH/a-Si:H interfaces;Robertson;J. Non-Cryst. Solids,1985

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